@ARTICLE{10.21494/ISTE.OP.2017.0182, TITLE={Residual stresses relaxation in heteroepitaxial growth of thin film}, AUTHOR={Khalil El-Hami, Aziz SOUFI, }, JOURNAL={Uncertainties and Reliability of Multiphysical Systems}, VOLUME={1}, NUMBER={Numéro 2}, YEAR={2017}, URL={https://openscience.fr/Residual-stresses-relaxation-in-heteroepitaxial-growth-of-thin-film}, DOI={10.21494/ISTE.OP.2017.0182}, ISSN={2514-569X}, ABSTRACT={The dynamic of edge dipoles dislocations nucleation’s from free lateral areas, near the thin film-substrate interfaces obtained by heteroepitaxial growth is discussed. The analysis method uses the superposition of image dislocations and Boussinesq surface forces distribution. The theoretical calculation is carried out using the conjugate gradient method and Mathematica code. This work reveals how the stability of edge dislocations dipoles, nucleated from lateral surface is very important to evacuate strains Misfit between mesh parameters.}}