TY  - Type of reference 
TI  - Probabilistic study of an embedded system 
AU  - Nadia Saadoune 
AU  - Bouchaïb Radi 
AB  - Embedded systems can be defined as autonomous electronic and computer systems which are increasingly used to control complex systems, they are found in medical equipment, ATMs, etc. The known drop test on the name "drop-test" is the most used method for assessing the reliability of solder joints, using the description of the procedure of the drop test according to the JEDEC standard [3]. In this article, we present a simulation of finite element model to reflect the maximum deformation due to temperature using the simulation software ANSYS Mechanical. It is considered that the parameters are random and proposed a probabilistic study of mechatronic system. 
DO  - 10.21494/ISTE.OP.2017.0119 
JF  - Uncertainties and Reliability of Multiphysical Systems 
KW  -  Monte Carlo simulation, Embedded System,  modeling,  RSM, Système embarqué,  modélisation,  simulation Monte Carlo,  RSM,  
L1  - https://openscience.fr/IMG/pdf/papier_radi-saadoune_done.pdf 
LA  - en 
PB  - ISTE OpenScience 
DA  - 2017/02/9 
SN  - 2514-569X 
TT  - Etude probabiliste d’un système embarqué 
UR  - https://openscience.fr/Probabilistic-study-of-an-embedded-system 
IS  - Optimization and Reliability 
VL  - 1 
ER  -