Titre : Enabling Fast‐prototyping of Connected Things using the WiNo* family 

Auteurs : Adrien van den Bossche, Réjane Dalcé, Thierry Val,  

Revue : Internet of Things 

Numéro : Issue 1 

Volume : 1 

Date : 2017/03/31 

DOI : 10.21494/ISTE.OP.2017.0138 

ISSN : 2514-8273 

Résumé : In order to be able to deploy the various solutions for the Device Layer of the Internet of Things, these proposals must be evaluated in terms of performance, scalability and repeatability. This paper introduces our test platform which was designed to be able to support these types of tests. We describe the wireless nodes which make up the test platform and present a selection of use cases. 

Éditeur : ISTE OpenScience